Congratulations to Dr. Michael Ruppert for receiving an ARC Discovery Early Career Researcher Award (DECRA) with funding of $444,471. Michael's project aims to develop a new versatile, high-performance microsensor platform and microscopy method for measuring nano-scale structures.
The proposed microscopy tool is expected to significantly increase imaging speed and miniaturise system footprint, thereby enabling high-throughput quality control of semiconductor devices.
The expected outcome is a highly-scalable and low-cost imaging system that will close the technology gap between fabrication and inspection at the nanoscale.
The benefits to Australia should include the potential for commercialization to develop this next-generation microscopy tool in high-value market sectors.